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β-Ga2O3 thick films epitaxy on c-plane sapphire substrate by carbothermal reduction rapid growth method

Liyuan CHENG, Hezhi ZHANG, Wenhui ZHANG, and Hongwei LIANG

  • School of Microelectronics, Dalian University of Technology; 

Corresponding Author: Hezhi ZHANG, hez.zhang@dlut.edu.cn;  Hongwei LIANG,  hwliang@dlut.edu.cn

Abstract: We investigated the influence of the growth temperature, O2 flow, molar ratio between Ga2O3 powder and graphite powder on the structure and morphology of the films grown on the c-plane sapphire (0001) substrates by carbothermal reduction method. Experimental results for the heteroepitaxial growth of β-Ga2O3 illustrate that β-Ga2O3 growth by carbothermal reduction method can be controlled. The optimal result was obtained at a growth temperature of 1050°C. The fastest growth rate of β-Ga2O3 films was produced when the O2 flow was 20 sccm. To guarantee that β-Ga2O3 films with both high-quality crystal and morphology properties, the ideal molar ratio between graphite powder and Ga2O3 powder should be set at 10:1.

Key words: β-Ga2O3 epitaxy; carbothermal reduction method; growth parameters


Cite as: JOSarXiv.202303.0001


Recommended references: Liyuan CHENG, Hezhi ZHANG, Wenhui ZHANG, Hongwei LIANG . (2023). β-Ga2O3 thick films epitaxy on c-plane sapphire substrate by carbothermal reduction rapid growth method. [JOSarXiv.202303.0001]   (Copy)

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[V1] 2023-03-01 04:51:28 JOSarXiv.202303.0001V1Download

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History

Manuscript received: 01 March 2023

Manuscript published: 02 March 2023

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