A cross-coupled interlocked-storage-cells-based quadruple-node upsets self-recoverable latch design

Abstract: With the shrinking technology size, CMOS circuits’ immunity to the space radiation environment decreases. As a result, when these deep submicron devices are used in memory cells in space environments, single-event upsets (SEUs), also known as soft errors, can cause permanent damage to devices. This paper proposed a latch design that can be self-recoverable from any possible quadruplenode upsets (QNUs). The latch includes four double interlocking modules, each of which comprises four interlocking units and has double-node upset (DNU) self-recovery ability. The simulation results show that the quadruple-node upset self-recoverable latch (QNUSRL) proposed in this paper has some advantages over the latest multi-node upsets (MNUs) tolerance latches. Compared with QNURL, the delay and area are reduced by 30.69%, 12.95%, respectively. The process, voltage, and temperature variation analysis show that the proposed QNUSRL latch is less sensitive to changes.

Key words: latch design; soft error; radiation hardened; quadruple-node upsets; process variations

Cite as: JOSarXiv.202112.0004

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